3,075 technical terms and definitions
scan test, scan insertion, dft basics, atpg compression
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
scan chain defect detection prediction, scan chain defect, chain defect detection, defect detection prediction, scan chain, chain defect, defect detection, detection prediction
Scan Chain Defect Detection Prediction with Machine Learning Introduction & Motivation Scan Chain Defect Detection Prediction with Machine Learning addresses a central problem…
scan chain defect localization prediction, scan chain defect, chain defect localization, defect localization prediction, scan chain, chain defect, defect localization
Scan Chain Defect Localization Prediction with Machine Learning Introduction & Motivation Scan Chain Defect Localization Prediction with Machine Learning addresses a central…
scan architecture, DFT scan, test compression, ATPG scan
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
dft scan, test compression, scan architecture
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
design & verification, dft, scan insertion, atpg, mux-d
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
scan chain test coverage prediction machine learning, scan chain, test coverage prediction, ate atpg, scan chain test coverage prediction, scan chain test, chain test coverage
Scan Chain Test Coverage Prediction with Machine Learning Introduction & Motivation Scan Chain Test Coverage Prediction with Machine Learning addresses a central problem in scan…
scan chain toggle rate and power dissipation during test, scan chain toggle, chain toggle rate, toggle rate power, rate power dissipation, power dissipation during, scan chain
Scan Chain Toggle Rate and Power Dissipation During Test Introduction & Motivation Scan Chain Toggle Rate and Power Dissipation During Test addresses a central problem in test…
advanced test & probe
Scan compression is a technique that reduces scan test data volume by compressing stimulus and responses - Decompressors expand tester patterns on-chip and compactors fold…
design & verification
Scan Compression is test-data reduction using on-chip decompression and compaction to cut tester bandwidth and test time - It is a core technique in advanced digital…
embedded deterministic test, scan channel compression, atpg compression architecture, test data reduction
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
scan compression ratio drift prediction, scan compression ratio, compression ratio drift, ratio drift prediction, scan compression, compression ratio, ratio drift, drift prediction
Scan Compression Ratio Drift Prediction with Machine Learning Introduction & Motivation Scan Compression Ratio Drift Prediction with Machine Learning addresses a central problem…
embedded deterministic test edt, test data volume reduction, decompressor compressor, scan test bandwidth
Scan Compression and Test Data Volume Reduction is the DFT methodology that uses on-chip decompressor and compressor hardware to dramatically reduce the amount of test data that…
design & verification
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
advanced test & probe
Scan insertion is the design-for-test process that converts selected registers into scan-capable elements - Automation tools replace standard flops with scan cells and connect…
scan path timing violation prediction, scan path timing, path timing violation, timing violation prediction, scan path, path timing, timing violation, violation prediction
Scan Path Timing Violation Prediction with Machine Learning Introduction & Motivation Scan Path Timing Violation Prediction with Machine Learning addresses a central problem…
scan chain, jtag test, boundary scan, dft scan
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
scan chain, ATPG, stuck at fault test, transition fault test, scan compression
Design-for-test architectures, automatic test pattern generation, and structural fault modeling constitute the digital verification and manufacturing test disciplines engineered…
scan test pattern fault coverage prediction, scan test pattern, test pattern fault, pattern fault coverage, fault coverage prediction, scan test, test pattern
Scan Test Pattern Fault Coverage Prediction with Machine Learning Introduction & Motivation Scan Test Pattern Fault Coverage Prediction with Machine Learning addresses a central…
google, efficient
ScaNN: Google's Efficient Vector Search Overview ScaNN (Scalable Nearest Neighbors) is a vector similarity search library open-sourced by Google Research. It powers search inside…
rag
ScaNN is the Google-developed approximate nearest-neighbor library optimized for efficient vector search using quantization and partitioning techniques - it targets strong…
lithography
A Scanner is a lithography tool that exposes wafers by synchronously scanning the reticle and wafer stage in opposite directions through a narrow illumination slit — projecting…
scanner dose mapping non uniformity prediction with machine learning, scanner dose mapping non uniformity prediction machine learning, scanner dose, cd, dose mapping
Scanner Dose Mapping Non-Uniformity Prediction with Machine Learning Introduction & Motivation Scanner Dose Mapping Non-Uniformity Prediction with Machine Learning addresses…
litho dose control, illumination uniformity correction scanner, cd uniformity dose
Scanner Dose Uniformity A lithography scanner doesn't expose a whole wafer in one flash — it steps the wafer under a narrow illumination slit and scans the slit across each field…
lithography
Scanner Matching ensures multiple lithography scanners produce consistent overlay and CD performance — characterizing and correcting individual scanner signatures to minimize…
scanner wafer exchange time prediction machine learning, scanner wafer, exchange time prediction, scanner wafer exchange time prediction, scanner wafer exchange, wafer exchange
Scanner Wafer Exchange Time Prediction with Machine Learning Introduction & Motivation Scanner Wafer Exchange Time Prediction with Machine Learning addresses a central problem…
scanning acoustic microscopy, sam, failure analysis
Scanning acoustic microscopy (SAM) is a non-destructive failure-analysis method that uses focused ultrasound to reveal internal defects in packaged parts and assembled structures.…
scanning capacitance microscopy dopant profile prediction, scanning capacitance microscopy, capacitance microscopy dopant, microscopy dopant profile
Scanning Capacitance Microscopy Dopant Profile Prediction with Machine Learning Introduction & Motivation Scanning Capacitance Microscopy Dopant Profile Prediction with Machine…
SCM, dopant profiling, AFM, capacitance voltage, junction depth, SIMS, atom probe tomography
Scanning Capacitance Microscopy Dopant Profiling Scanning capacitance microscopy maps dopant type and concentration across a device cross-section by measuring something neither…
scanning electron microscope, sem, metrology
Scanning Electron Microscope (SEM) is the most widely used high-resolution imaging tool in semiconductor manufacturing — scanning a focused electron beam across a surface…
critical dimension CD measurement, secondary electron imaging, electron beam metrology, SEM defect detection, beam spot size focus, backscattered electron analysis, high resolution nanostructure imaging
Scanning electron microscopy forms an image by rastering a focused electron beam across a sample surface and detecting the electrons that the beam-sample interaction produces…
scanning electron microscopy defect morphology, scanning electron microscopy, electron microscopy defect, microscopy defect morphology, scanning electron, electron microscopy
Scanning Electron Microscopy Defect Morphology with Machine Learning Introduction & Motivation Scanning Electron Microscopy Defect Morphology with Machine Learning addresses…
metrology
Scanning Kelvin probe microscopy (SKPM), also called Kelvin probe force microscopy (KPFM), uses an oscillating atomic force microscope (AFM) cantilever tip to measure contact…
scanning microwave impedance microscopy carrier density prediction, scanning microwave impedance, microwave impedance microscopy, scanning microwave
Scanning Microwave Impedance Microscopy Carrier Density Prediction with Machine Learning Introduction & Motivation Scanning Microwave Impedance Microscopy Carrier Density…
smm, metrology
Spectroscopic ellipsometry and inline optical wafer metrology constitute the non-destructive physical measurement and defect detection disciplines that govern yield control across…
scanning near-field optical microscopy, snom, metrology
Scanning Near-Field Optical Microscopy (SNOM/NSOM) is an optical imaging technique that overcomes the diffraction limit of conventional far-field microscopy by scanning…
scanning probe microscopy, spm, metrology
Scanning Probe Microscopy (SPM) is a family of surface characterization techniques that measure surface properties by scanning a sharp physical probe across the sample — achieving…
ssrm, metrology, dopant profiling, diamond AFM tip, spreading resistance, staircase calibration, FinFET characterization, 2D doping profile, carrier concentration mapping
Scanning spreading resistance microscopy (SSRM) is a contact-mode atomic force microscopy technique that maps dopant concentration across a two-dimensional cross-section of…
metrology
Scanning Surface Inspection Systems (SSIS) are the automated laser-scanning metrology tools that perform full-wafer defect mapping on bare or patterned wafers — generating…
scanning tunneling microscope, stm, metrology
Scanning Tunneling Microscope (STM) is a surface analysis instrument that achieves true atomic resolution by measuring quantum mechanical tunneling current between an atomically…
SCARF Self-Supervised Contrastive Learning using Random Feature Corruption Introduction & Motivation SCARF Self-Supervised Contrastive Learning using Random Feature Corruption…
Anscombes quartet, overplotting, jittering, Simpsons paradox visualized, trend line
A scatter plot represents the relationship between two numerical variables by plotting each observation as a single point, with one variable's value determining its horizontal…
quality & reliability
Scatter Plot Quality is a bivariate plot used to examine relationships between candidate cause variables and quality responses - It is a core method in modern semiconductor…
lithography
A scattering bar is the most common type of sub-resolution assist feature (SRAF) — a thin line placed on the photomask parallel to and near a main feature to improve its imaging…
device physics
Scattering Mechanisms are the physical interactions that interrupt the ballistic motion of charge carriers (electrons and holes) in a semiconductor, transferring momentum…
optical scatterometry, semiconductor scatterometry, grating scatterometry
Optical critical-dimension scatterometry infers the average geometry of a periodic semiconductor pattern from how that pattern changes reflected or diffracted light. The tool may…
euv scatterometry, euv metrology, actinic scatterometry, lithography metrology
EUV Scatterometry is the optical metrology technique that uses extreme ultraviolet light at 13.5 nm wavelength to measure critical dimensions, overlay, and film properties…
inline cd measurement, optical profile metrology, scatterometry sidewall angle
Optical critical-dimension scatterometry infers the average geometry of a periodic semiconductor pattern from how that pattern changes reflected or diffracted light. The tool may…
scatterometry cd measurement drift prediction machine learning, scatterometry cd, measurement drift prediction, cd, scatterometry cd measurement drift prediction
Scatterometry CD Measurement Drift Prediction with Machine Learning Introduction & Motivation Scatterometry CD Measurement Drift Prediction with Machine Learning addresses…
scatterometry inverse modeling with neural network machine learning, scatterometry inverse modeling, inverse modeling neural, modeling neural network, inverse modeling
Scatterometry Inverse Modeling with Neural Network Machine Learning Introduction & Motivation Scatterometry Inverse Modeling with Neural Network Machine Learning addresses…